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ISSRE
2007
IEEE
13 years 11 months ago
Using In-Process Testing Metrics to Estimate Post-Release Field Quality
In industrial practice, information on the software field quality of a product is available too late in the software lifecycle to guide affordable corrective action. An important ...
Nachiappan Nagappan, Laurie Williams, Mladen A. Vo...
BMCBI
2007
172views more  BMCBI 2007»
13 years 9 months ago
msBayes: Pipeline for testing comparative phylogeographic histories using hierarchical approximate Bayesian computation
Background: Although testing for simultaneous divergence (vicariance) across different population-pairs that span the same barrier to gene flow is of central importance to evoluti...
Michael J. Hickerson, Eli Stahl, Naoki Takebayashi
ECCC
2010
99views more  ECCC 2010»
13 years 9 months ago
A Unified Framework for Testing Linear-Invariant Properties
Abstract--There has been a sequence of recent papers devoted to understanding the relation between the testability of properties of Boolean functions and the invariance of the prop...
Arnab Bhattacharyya, Elena Grigorescu, Asaf Shapir...
ATVA
2008
Springer
144views Hardware» more  ATVA 2008»
13 years 11 months ago
Tests, Proofs and Refinements
1 : Logic in Specification and Verification (abstract) Natarajan Shankar (SRI) Session Chair : Sungdeok Cha 12 : 00 13 : 00 Lunch 13 : 00 15 : 00 2 : Boolean Modeling of Cell Biolo...
Sriram K. Rajamani
ITC
1997
IEEE
94views Hardware» more  ITC 1997»
14 years 1 months ago
Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points and on IDD switching transients on the sup...
James F. Plusquellic, Donald M. Chiarulli, Steven ...