747 search results - page 5 / 150 » Testing for tunneling opens |
EUROPAR
2004
Springer
14 years 25 days ago
2004
Springer
The APART working group is developing the APART Test Suite (ATS) for evaluating (automatic) performance analysis tools with respect to their correctness – that is, their ability...
VLSID
2004
IEEE
14 years 7 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...
GLVLSI
2002
IEEE
14 years 12 days ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...