1664 search results - page 21 / 333 » Testing in the Component Age |
101
Voted
SOFTWARE
1998
15 years 3 months ago
1998
97
Voted
SCP
2010
15 years 1 months ago
2010
140
Voted
TOOLS
2000
IEEE
15 years 7 months ago
2000
IEEE
This paper presents a method and a tool for building trustable OO components. The methodology is based on an integrated design and test approach for OO software components. It is ...
154
Voted
DATE
2010
IEEE
15 years 8 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
140
Voted
HVEI
2010
15 years 3 months ago
2010
Factors governing human preference for artwork have long been studied but there remain many holes in our understanding. Bearing in mind contextual factors (both the conditions und...