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» Testing in the Component Age
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PTS
2003
115views Hardware» more  PTS 2003»
13 years 10 months ago
Realizing Distributed TTCN-3 Test Systems with TCI
Distributed test setups for efficient load, performance, scalability, interworking, and end-to-end tests are gaining importance for the assessment of distributed communicating syst...
Ina Schieferdecker, Theofanis Vassiliou-Gioles
GPCE
2003
Springer
14 years 1 months ago
A Case for Test-Code Generation in Model-Driven Systems
A primary goal of generative programming and model-driven ent is to raise the level of abstraction at which designers and developers interact with the software systems they are bui...
Matthew J. Rutherford, Alexander L. Wolf
ICCD
1999
IEEE
93views Hardware» more  ICCD 1999»
14 years 1 months ago
Using an Embedded Processor for Efficient Deterministic Testing of Systems-on-a-Chip
If a system-on-a-chip (SOC) contains an embedded processor, this paper presents a novel approach for using the processor to aid in testing the other components of the SOC. The bas...
Abhijit Jas, Nur A. Touba
ET
2002
72views more  ET 2002»
13 years 8 months ago
Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor
Abstract. A novel approach for using an embedded processor to aid in deterministic testing of the other components of a system-on-a-chip (SOC) is presented. The tester loads a prog...
Abhijit Jas, Nur A. Touba
ITC
2003
IEEE
127views Hardware» more  ITC 2003»
14 years 2 months ago
Architecting Millisecond Test Solutions for Wireless Phone RFIC's
Today’s low cost wireless phones have driven a need to be able to economically test high volumes of complex RF IC’s at a fraction of the cost of the IC. In June of 2001 the IB...
John Ferrario, Randy Wolf, Steve Moss