1215 search results - page 21 / 243 » Testing in the Distributed Test Architecture: An Extended Ab... |
ISSTA
2006
ACM
14 years 1 months ago
2006
ACM
Testing with random inputs can give surprisingly good results if the distribution of inputs is spread out evenly over the input domain; this is the intuition behind Adaptive Rando...
ICML
2010
IEEE
13 years 8 months ago
2010
IEEE
Imagine two identical people receive exactly the same training on how to classify certain objects. Perhaps surprisingly, we show that one can then manipulate them into classifying...
VTS
2003
IEEE
14 years 24 days ago
2003
IEEE
With increasing circuit complexity and reliability requirements, screening outlier chips is an increasingly important test challenge. This is especially true for IDDQ test due to ...
IJCAI
2007
13 years 9 months ago
2007
Some Statistical Software Testing approaches rely on sampling the feasible paths in the control flow graph of the program; the difficulty comes from the tiny ratio of feasible p...
CATA
2009
13 years 8 months ago
2009
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...