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» Testing in the Fourth Dimension
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EH
2000
IEEE
109views Hardware» more  EH 2000»
13 years 12 months ago
Bidirectional Incremental Evolution in Extrinsic Evolvable Hardware
Evolvable Hardware (EHW) has been proposed as a new technique to design complex systems. Often, complex systems turn out to be very difficult to evolve. The problem is that a gen...
Tatiana Kalganova
SSIAI
2000
IEEE
13 years 12 months ago
Two-Dimensional Phase Unwrapping Using Neural Networks
Imaging systems that construct an image from phase information in received signals include synthetic aperture radar (SAR) and optical Doppler tomography (ODT) systems. A fundament...
Wade Schwartzkopf, Thomas E. Milner, Joydeep Ghosh...
COLT
2000
Springer
13 years 12 months ago
Model Selection and Error Estimation
We study model selection strategies based on penalized empirical loss minimization. We point out a tight relationship between error estimation and data-based complexity penalizatio...
Peter L. Bartlett, Stéphane Boucheron, G&aa...
SSDBM
1999
IEEE
108views Database» more  SSDBM 1999»
13 years 12 months ago
Supporting Imprecision in Multidimensional Databases Using Granularities
On-Line Analytical Processing (OLAP) technologies are being used widely, but the lack of effective means of handling data imprecision, which occurs when exact values are not known...
Torben Bach Pedersen, Christian S. Jensen, Curtis ...
DAC
2010
ACM
13 years 11 months ago
Representative path selection for post-silicon timing prediction under variability
The identification of speedpaths is required for post-silicon (PS) timing validation, and it is currently becoming timeconsuming due to manufacturing variations. In this paper we...
Lin Xie, Azadeh Davoodi