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ITC
2003
IEEE
136views Hardware» more  ITC 2003»
14 years 2 months ago
A BIST Solution for The Test of I/O Speed
A delay-locked loop (DLL) based built-in self test (BIST) circuit has been designed with a 0.18 µ m TSMC process (CM018) to test chip I/O speeds, specifically, the setup and hold...
Cheng Jia, Linda S. Milor
ICIP
2007
IEEE
14 years 10 months ago
Identifying Common Source Digital Camera from Image Pairs
In this paper, we propose a method for verifying whether two digital images were obtained using the same digital camera. The method uses test statistics derived from a twochannel ...
Miroslav Goljan, Mo Chen, Jessica J. Fridrich
ICMCS
2006
IEEE
119views Multimedia» more  ICMCS 2006»
14 years 3 months ago
Video News Shot Labeling Refinement via Shot Rhythm Models
We present a three-step post-processing method for increasing the precision of video shot labels in the domain of television news. First, we demonstrate that news shot sequences c...
John R. Kender, Milind R. Naphade
NIPS
2000
13 years 10 months ago
Rate-coded Restricted Boltzmann Machines for Face Recognition
We describe a neurally-inspired, unsupervised learning algorithm that builds a non-linear generative model for pairs of face images from the same individual. Individuals are then ...
Yee Whye Teh, Geoffrey E. Hinton
ICASSP
2010
IEEE
13 years 9 months ago
Multiantenna spectrum sensing: Detection of spatial correlation among time-series with unknown spectra
One of the key problems in cognitive radio (CR) is the detection of primary activity in order to determine which parts of the spectrum are available for opportunistic access. This...
David Ramírez, Javier Vía, Ignacio S...