2686 search results - page 11 / 538 » Testing metric properties |
VTS
2003
IEEE
14 years 3 months ago
2003
IEEE
With increasing circuit complexity and reliability requirements, screening outlier chips is an increasingly important test challenge. This is especially true for IDDQ test due to ...
ECOOP
2007
Springer
14 years 1 months ago
2007
Springer
Refactoring is not only useful for source code of implementations, but as well for test specifications. The open source TRex tool automates the application of refactorings and the ...
COMPSAC
2010
IEEE
13 years 7 months ago
2010
IEEE
Abstract--Test cost minimisation approaches have traditionally been devoted to minimising "execution costs", while maximising coverage or reliability. However, in a runti...
FATES
2005
Springer
14 years 3 months ago
2005
Springer
We propose a novel, practical coverage metric called “location pairs” (LP) for concurrently-accessed software components. The LP metric captures well common concurrency errors ...
INEX
2004
Springer
14 years 3 months ago
2004
Springer
In this paper we compare the effectiveness scores and system rankings obtained with the inex-2002 metric, the official measure of INEX 2004, and the XCG metrics proposed in [4] an...