2686 search results - page 2 / 538 » Testing metric properties |
JWSR
2008
13 years 7 months ago
2008
Organizations are increasingly faced with the challenge of managing business processes, workflows, and recently, Web processes. One important aspect of business processes that has...
DFT
2002
IEEE
14 years 1 months ago
2002
IEEE
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
METRICS
2003
IEEE
14 years 1 months ago
2003
IEEE
When it is impractical to rigorously assess all parts of complex systems, test engineers use defect detectors to focus their limited resources. In this article, we define some pr...
IMR
2003
Springer
14 years 1 months ago
2003
Springer
A local cell quality metric is introduced and used to construct a variational functional for a grid smoothing algorithm. A maximum principle is proved and the properties of the loc...
COMSNETS
2012
12 years 4 months ago
2012
—Researchers choosing to share wireless-network traces with colleagues must first anonymize sensitive information, trading off the removal of information in the interest of iden...