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TVLSI
2008
133views more  TVLSI 2008»
13 years 10 months ago
Test Data Compression Using Selective Encoding of Scan Slices
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
Zhanglei Wang, Krishnendu Chakrabarty
ASPLOS
2012
ACM
12 years 5 months ago
Path-exploration lifting: hi-fi tests for lo-fi emulators
Processor emulators are widely used to provide isolation and instrumentation of binary software. However they have proved difficult to implement correctly: processor specificati...
Lorenzo Martignoni, Stephen McCamant, Pongsin Poos...
BMCBI
2006
101views more  BMCBI 2006»
13 years 10 months ago
SynTReN: a generator of synthetic gene expression data for design and analysis of structure learning algorithms
Background: The development of algorithms to infer the structure of gene regulatory networks based on expression data is an important subject in bioinformatics research. Validatio...
Tim Van den Bulcke, Koen Van Leemput, Bart Naudts,...
VTS
2003
IEEE
115views Hardware» more  VTS 2003»
14 years 3 months ago
Fault Testing for Reversible Circuits
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
Ketan N. Patel, John P. Hayes, Igor L. Markov
AAAI
2000
13 years 11 months ago
What Sensing Tells Us: Towards a Formal Theory of Testing for Dynamical Systems
Just as actions can have indirect effects on the state of the world, so too can sensing actions have indirect effects on an agent's state of knowledge. In this paper, we inve...
Sheila A. McIlraith, Richard B. Scherl