1618 search results - page 34 / 324 » Testing random number generators |
VTS
2002
IEEE
14 years 2 months ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
IWANN
2009
Springer
14 years 4 months ago
2009
Springer
Generating test data for formal state based specifications is computationally expensive. This paper improves a framework that addresses this issue by representing the test data ge...
CIMAGING
2010
13 years 11 months ago
2010
Undersea localization requires a computationally expensive partial differential equation simulation to test each candidate hypothesis location via matched filter. We propose a met...
DATE
1999
IEEE
14 years 2 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
CEC
2008
IEEE
14 years 4 months ago
2008
IEEE
— Quasirandom or low discrepancy sequences, such as the Van der Corput, Sobol, Faure, Halton (named after their inventors) etc. are less random than a pseudorandom number sequenc...