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VTS
1997
IEEE
86views Hardware» more  VTS 1997»
14 years 2 months ago
Methods to reduce test application time for accumulator-based self-test
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Albrecht P. Stroele, Frank Mayer
BMCBI
2010
175views more  BMCBI 2010»
13 years 10 months ago
Calibur: a tool for clustering large numbers of protein decoys
Background: Ab initio protein structure prediction methods generate numerous structural candidates, which are referred to as decoys. The decoy with the most number of neighbors of...
Shuai Cheng Li, Yen Kaow Ng
ECBS
2011
IEEE
197views Hardware» more  ECBS 2011»
12 years 9 months ago
Finding Interaction Faults Adaptively Using Distance-Based Strategies
Abstract—Software systems are typically large and exhaustive testing of all possible input parameters is usually not feasible. Testers select tests that they anticipate may catch...
Renée C. Bryce, Charles J. Colbourn, D. Ric...
ISPA
2004
Springer
14 years 3 months ago
A Scalable Low Discrepancy Point Generator for Parallel Computing
The Monte Carlo (MC) method is a simple but effective way to perform simulations involving complicated or multivariate functions. The QuasiMonte Carlo (QMC) method is similar but...
Kwong-Ip Liu, Fred J. Hickernell
ATS
2010
IEEE
261views Hardware» more  ATS 2010»
13 years 8 months ago
The Test Ability of an Adaptive Pulse Wave for ADC Testing
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
Xiaoqin Sheng, Hans G. Kerkhoff