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DAC
2000
ACM
14 years 11 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
ICSM
2005
IEEE
14 years 3 months ago
An Empirical Comparison of Test Suite Reduction Techniques for User-Session-Based Testing of Web Applications
Automated cost-effective test strategies are needed to provide reliable, secure, and usable web applications. As a software maintainer updates an application, test cases must accu...
Sara Sprenkle, Sreedevi Sampath, Emily Gibson, Lor...
AMOST
2005
ACM
14 years 3 months ago
Test prioritization for pairwise interaction coverage
Interaction testing is widely used in screening for faults. In software testing, it provides a natural mechanism for testing systems to be deployed on a variety of hardware and so...
Renée C. Bryce, Charles J. Colbourn
ATS
2003
IEEE
105views Hardware» more  ATS 2003»
14 years 3 months ago
Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. R...
DICTA
2003
13 years 11 months ago
Testing for Curves in a Binary Image
Abstract. Curve detection is viewed as a process of hypothesis generation and hypothesis testing. Of the two, hypothesis generation has received much attention and many sophisticat...
Y. C. Cheng