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» Testing random number generators
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NAACL
2007
13 years 11 months ago
Randomized Decoding for Selection-and-Ordering Problems
The task of selecting and ordering information appears in multiple contexts in text generation and summarization. For instance, methods for title generation construct a headline b...
Pawan Deshpande, Regina Barzilay, David R. Karger
IFL
2007
Springer
162views Formal Methods» more  IFL 2007»
14 years 4 months ago
Testing Erlang Refactorings with QuickCheck
Abstract. Refactoring is a technique for improving the design of existing programs without changing their behaviour. Wrangler is a tool built at the University of Kent to support E...
Huiqing Li, Simon Thompson
COMPGEOM
2000
ACM
14 years 2 months ago
Pitfalls in computing with pseudorandom determinants
It has been known for 30 years that pseudorandom number generators in the class of linear congruential generators (LCG) exhibit strong and predictable regularities. A widely used ...
Bernd Gärtner
CEC
2005
IEEE
14 years 3 months ago
Dynamic power minimization during combinational circuit testing as a traveling salesman problem
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley,...
ASPDAC
2007
ACM
108views Hardware» more  ASPDAC 2007»
14 years 2 months ago
Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz