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» Testing random number generators
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VLSID
1996
IEEE
110views VLSI» more  VLSID 1996»
15 years 6 months ago
On test coverage of path delay faults
W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
CORR
2000
Springer
100views Education» more  CORR 2000»
15 years 2 months ago
Perfect simulation from the Quicksort limit distribution
The weak limit of the normalized number of comparisons needed by the Quicksort algorithm to sort n randomly permuted items is known to be determined implicitly by a distributional...
Luc Devroye, James Allen Fill, Ralph Neininger
CORR
2010
Springer
162views Education» more  CORR 2010»
15 years 2 months ago
Random sampling of lattice paths with constraints, via transportation
We investigate Monte Carlo Markov Chain (MCMC) procedures for the random sampling of some one-dimensional lattice paths with constraints, for various constraints. We will see that...
Lucas Gerin
CMMR
2005
Springer
69views Music» more  CMMR 2005»
15 years 8 months ago
Generating and Modifying Melody Using Editable Noise Function
This paper introduces a way to generate or modify a melody using the editable noise function. The band-limited random numbers generated by the noise function are converted to the v...
Yong-Woo Jeon, In-Kwon Lee, Jong-Chul Yoon
149
Voted
ICASSP
2011
IEEE
14 years 6 months ago
A flexible high-throughput hardware architecture for a gaussian noise generator
In this paper a exible, high-throughput, low-complexity additive white gaussian noise (AWGN) channel generator is presented. The proposed generator employs a Mersenne-Twister to g...
Ioannis Paraskevakos, Vassilis Paliouras