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» Testing random number generators
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VLSID
1996
IEEE
110views VLSI» more  VLSID 1996»
14 years 2 months ago
On test coverage of path delay faults
W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
CORR
2000
Springer
100views Education» more  CORR 2000»
13 years 10 months ago
Perfect simulation from the Quicksort limit distribution
The weak limit of the normalized number of comparisons needed by the Quicksort algorithm to sort n randomly permuted items is known to be determined implicitly by a distributional...
Luc Devroye, James Allen Fill, Ralph Neininger
CORR
2010
Springer
162views Education» more  CORR 2010»
13 years 10 months ago
Random sampling of lattice paths with constraints, via transportation
We investigate Monte Carlo Markov Chain (MCMC) procedures for the random sampling of some one-dimensional lattice paths with constraints, for various constraints. We will see that...
Lucas Gerin
CMMR
2005
Springer
69views Music» more  CMMR 2005»
14 years 3 months ago
Generating and Modifying Melody Using Editable Noise Function
This paper introduces a way to generate or modify a melody using the editable noise function. The band-limited random numbers generated by the noise function are converted to the v...
Yong-Woo Jeon, In-Kwon Lee, Jong-Chul Yoon
ICASSP
2011
IEEE
13 years 1 months ago
A flexible high-throughput hardware architecture for a gaussian noise generator
In this paper a exible, high-throughput, low-complexity additive white gaussian noise (AWGN) channel generator is presented. The proposed generator employs a Mersenne-Twister to g...
Ioannis Paraskevakos, Vassilis Paliouras