6800 search results - page 176 / 1360 » Testing with Functions as Specifications |
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
A delay-locked loop (DLL) based built-in self test (BIST) circuit has been designed with a 0.18 µ m TSMC process (CM018) to test chip I/O speeds, specifically, the setup and hold...
JSW
2007
13 years 9 months ago
2007
—Higher-order black box software tests against independent end user domain requirements has become an issue of increasing importance with compositional reuse of software artifact...
ESANN
2004
13 years 11 months ago
2004
Abstract. In most ICA algorithms, the separation performances are estimated through the evaluation of a contrast function , used in the update rule of elements of the unmixing matr...
ACL
2009
13 years 7 months ago
2009
This paper describes our system for generating Chinese aspect expressions. In the system, the semantics of different aspects is characterized by specific temporal and conceptual f...
DAC
1997
ACM
14 years 1 months ago
1997
ACM
Novel test bench techniques are required to cope with a functional test complexity which is predicted to grow much more strongly than design complexity. Our test bench approach at...