6800 search results - page 195 / 1360 » Testing with Functions as Specifications |
VLSID
2002
IEEE
14 years 10 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
ESEM
2009
ACM
14 years 1 months ago
2009
ACM
Test coverage is a promising measure of test effectiveness and development organizations are interested in costeffective levels of coverage that provide sufficient fault removal w...
CPHYSICS
2006
13 years 9 months ago
2006
A new stochastic clustering algorithm is introduced that aims to locate all the local minima of a multidimensional continuous and differentiable function inside a bounded domain. ...
BMCBI
2006
13 years 9 months ago
2006
Background: Existing biological databases support a variety of queries such as keyword or definition search. However, they do not provide any measure of relevance for the instance...
CPHYSICS
2006
13 years 9 months ago
2006
This article introduces a tool for data fitting that is based on genetic programming and especially on the grammatical evolution technique. The user needs to input a series of poi...