2006 search results - page 257 / 402 » Testing with Respect to Concerns |
147
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DAC
2005
ACM
15 years 5 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
127
Voted
DAC
2008
ACM
15 years 5 months ago
2008
ACM
Security of MPSoCs is an emerging area of concern in embedded systems. Security is jeopardized by code injection attacks, which are the most common types of software attacks. Prev...
117
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LREC
2010
15 years 4 months ago
2010
This paper presents the EPAC corpus which is composed by a set of 100 hours of conversational speech manually transcribed and by the outputs of automatic tools (automatic segmenta...
120
Voted
LREC
2008
15 years 4 months ago
2008
The present contribution aims at increasing our understanding of automatic speech recognition (ASR) errors involving frequent homophone or almost homophone words by confronting th...
166
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CSREAESA
2006
15 years 4 months ago
2006
The Satellite Data Model (SDM) is part of the Air Force Research Laboratory (AFRL) Responsive Space Testbed Initiative. It is a developing standard for rapid integration of hardwa...