2006 search results - page 291 / 402 » Testing with Respect to Concerns |
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
HICSS
2007
IEEE
14 years 3 months ago
2007
IEEE
Auto ID systems can replace time-consuming, costly and error-prone processes of human data entry and produce detailed real time information. However, they will add value only to t...
ICC
2007
IEEE
14 years 3 months ago
2007
IEEE
—Dynamic Bandwidth allocation in Ethernet Passive Optical Networks (EPONs) has been an area of intense research in recent years. Most of the proposed solutions offer clever metho...
IJCNN
2007
IEEE
14 years 3 months ago
2007
IEEE
— Fuzzy Cognitive Maps (FCMs) are a class of discrete-time Artificial Neural Networks that are used to model dynamic systems. A recently introduced supervised learning method, wh...
IJCNN
2007
IEEE
14 years 3 months ago
2007
IEEE
— In this paper, a method based on wavelet coefficients in low-pass bands is proposed for the image classification with adaptive processing of data structures to organize a large...