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ICCAD
1995
IEEE
94views Hardware» more  ICCAD 1995»
13 years 11 months ago
Test register insertion with minimum hardware cost
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...
Albrecht P. Stroele, Hans-Joachim Wunderlich
ICSE
2005
IEEE-ACM
14 years 7 months ago
A framework of greedy methods for constructing interaction test suites
Greedy algorithms for the construction of software interaction test suites are studied. A framework is developed to evaluate a large class of greedy methods that build suites one ...
Charles J. Colbourn, Myra B. Cohen, Renée C...
SODA
2010
ACM
157views Algorithms» more  SODA 2010»
14 years 5 months ago
Testing monotone high-dimensional distributions
A monotone distribution P over a (partially) ordered domain assigns higher probability to y than to x if y x in the order. We study several natural problems concerning testing pr...
Ronitt Rubinfeld, Rocco A. Servedio
DATE
2008
IEEE
122views Hardware» more  DATE 2008»
14 years 2 months ago
Digital bit stream jitter testing using jitter expansion
This paper presents a time-domain jitter expansion technique for high-speed digital bit sequence jitter testing. While jitter expansion has been applied to phase noise measurement...
Hyun Choi, Abhijit Chatterjee
COMPSAC
2004
IEEE
13 years 11 months ago
Web Application Bypass Testing
Input validation refers to checking user inputs to a program to ensure that they conform to expectations of the program. Input validation is used to check the format of numbers and...
Jeff Offutt, Ye Wu, Xiaochen Du, Hong Huang