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IOLTS
2006
IEEE
101views Hardware» more  IOLTS 2006»
14 years 3 months ago
Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury,...
ECCV
2010
Springer
14 years 2 months ago
SuperParsing: Scalable Nonparametric Image Parsing with Superpixels
This paper presents a simple and effective nonparametric approach to the problem of image parsing, or labeling image regions (in our case, superpixels produced by bottom-up segmen...
CVPR
2011
IEEE
13 years 6 months ago
Shape Grammar Parsing via Reinforcement Learning
This paper tackles shape grammar parsing for facade segmentation using a novel optimization approach based on reinforcement learning (RL). To this end, we use a binary recursive g...
Olivier Teboul, Iasonas Kokkinos, Panagiotis Kouts...
CVPR
2011
IEEE
13 years 6 months ago
Boundary Preserving Dense Local Regions
We propose a dense local region detector to extract features suitable for image matching and object recognition tasks. Whereas traditional local interest operators rely on repeata...
Jaechul Kim, Kristen Grauman
CVPR
2012
IEEE
12 years 8 days ago
Boosting bottom-up and top-down visual features for saliency estimation
Despite significant recent progress, the best available visual saliency models still lag behind human performance in predicting eye fixations in free-viewing of natural scenes. ...
Ali Borji