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» The Complexity of Planarity Testing
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DATE
2004
IEEE
131views Hardware» more  DATE 2004»
15 years 7 months ago
Efficient Modular Testing of SOCs Using Dual-Speed TAM Architectures
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
Anuja Sehgal, Krishnendu Chakrabarty
ET
2000
145views more  ET 2000»
15 years 3 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar
ATAL
2009
Springer
15 years 10 months ago
A mixed multi-unit combinatorial auctions test suite
Supply Chain Formation (SCF) is the process of determining the participants in a supply chain, who will exchange what with whom, and the terms of the exchanges. Mixed multi-unit c...
Andrea Giovannucci, Jesús Cerquides, Ulle E...
GECCO
2007
Springer
156views Optimization» more  GECCO 2007»
15 years 10 months ago
Hierarchical genetic programming based on test input subsets
Crucial to the more widespread use of evolutionary computation techniques is the ability to scale up to handle complex problems. In the field of genetic programming, a number of d...
David Jackson
SERA
2005
Springer
15 years 9 months ago
A Design and Test Technique for Embedded Software
In recent years, embedded systems have become so complex and the development time to market is required to be shorter than before. As embedded systems include more functions for n...
Byeongdo Kang, Young-Jik Kwon, Roger Y. Lee