2877 search results - page 101 / 576 » The Complexity of Planarity Testing |
158
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COMPSAC
2003
IEEE
15 years 9 months ago
2003
IEEE
Short product cycles and rapidly changing requirements are increasingly forcing developers to use agile development strategies like extreme programming and test–driven developme...
103
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METRICS
2003
IEEE
15 years 9 months ago
2003
IEEE
When it is impractical to rigorously assess all parts of complex systems, test engineers use defect detectors to focus their limited resources. In this article, we define some pr...
127
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MTDT
2003
IEEE
15 years 9 months ago
2003
IEEE
Abstract: The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a ne...
123
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ITC
2002
IEEE
15 years 9 months ago
2002
IEEE
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
127
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PTS
2007
15 years 5 months ago
2007
Abstract. We propose an extension of the Finite State Machine framework in distributed systems, using input/output partial order automata (IOPOA). In this model, transitions can be...