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» The Complexity of Planarity Testing
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126
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DELTA
2004
IEEE
15 years 7 months ago
Scan Test of IP Cores in an ATE Environment
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
Luca Schiano, Yong-Bin Kim, Fabrizio Lombardi
137
Voted
SSIRI
2010
15 years 2 months ago
A Formal Framework for Mutation Testing
— Model-based approaches, especially based on directed graphs (DG), are becoming popular for mutation testing as they enable definition of simple, nevertheless powerful, mutation...
Fevzi Belli, Mutlu Beyazit
SAC
2009
ACM
15 years 11 months ago
A passive conformance testing approach for a MANET routing protocol
In this paper we propose a passive conformance testing technique applied to a Mobile ad hoc network (MANET) routing protocol, OLSR, that is characterized by a dynamically changing...
Ana R. Cavalli, Stéphane Maag, Edgardo Mont...
135
Voted
APPROX
2009
Springer
137views Algorithms» more  APPROX 2009»
15 years 10 months ago
Testing Computability by Width Two OBDDs
Property testing is concerned with deciding whether an object (e.g. a graph or a function) has a certain property or is “far” (for some definition of far) from every object w...
Dana Ron, Gilad Tsur
DATE
2007
IEEE
155views Hardware» more  DATE 2007»
15 years 10 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...