2877 search results - page 156 / 576 » The Complexity of Planarity Testing |
157
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STOC
2007
ACM
16 years 4 months ago
2007
ACM
In this work, we consider the problems of testing whether a distribution over {0, 1}n is k-wise (resp. ( , k)-wise) independent using samples drawn from that distribution. For the...
159
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ISQED
2006
IEEE
15 years 10 months ago
2006
IEEE
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
129
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NPAR
2006
ACM
15 years 10 months ago
2006
ACM
We present techniques to create convincing high-quality watercolor illustrations of plants. Mainly focusing on the real-time rendering, we introduce methods to abstract the visual...
131
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CSDA
2006
15 years 4 months ago
2006
We explore different approaches for performing hypothesis tests on the shape of a mean function by developing general methodologies both, for the often assumed, i.i.d. error struc...
136
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JUCS
2007
15 years 4 months ago
2007
: This paper describes a method of using Petri net P-invariants in system diagnosis. To model this process a net oriented fault classification is presented. Hence, the considered d...