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» The Complexity of Planarity Testing
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VLSID
2007
IEEE
94views VLSI» more  VLSID 2007»
14 years 9 months ago
A Reduced Complexity Algorithm for Minimizing N-Detect Tests
? We give a new recursive rounding linear programming (LP) solution to the problem of N-detect test minimzation. This is a polynomialtime solution that closely approximates the exa...
Kalyana R. Kantipudi, Vishwani D. Agrawal
ISSRE
2005
IEEE
14 years 2 months ago
Prioritize Code for Testing to Improve Code Coverage of Complex Software
Code prioritization for testing promises to achieve the maximum testing coverage with the least cost. This paper presents an innovative method to provide hints on which part of co...
J. Jenny Li
ICALP
2005
Springer
14 years 2 months ago
Quantum Complexity of Testing Group Commutativity
We consider the problem of testing the commutativity of a black-box group specified by its k generators. The complexity (in terms of k) of this problem was first considered by Pa...
Frédéric Magniez, Ashwin Nayak
COCOA
2011
Springer
12 years 8 months ago
The Complexity of Testing Monomials in Multivariate Polynomials
The work in this paper is to initiate a theory of testing monomials in multivariate polynomials. The central question is to ask whether a polynomial represented by certain economi...
Zhixiang Chen, Bin Fu
ICCD
2006
IEEE
105views Hardware» more  ICCD 2006»
14 years 3 months ago
A New Class of Sequential Circuits with Acyclic Test Generation Complexity
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
Chia Yee Ooi, Hideo Fujiwara