2877 search results - page 368 / 576 » The Complexity of Planarity Testing |
234
Voted
GIS
2006
ACM
16 years 5 months ago
2006
ACM
A cartogram is a thematic map that visualizes statistical data about a set of regions like countries, states or provinces. The size of a region in a cartogram corresponds to a par...
135
click to vote
DAC
2009
ACM
16 years 5 months ago
2009
ACM
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective technique that provides real-time visibility to ...
146
click to vote
DAC
2009
ACM
16 years 5 months ago
2009
ACM
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
124
click to vote
DAC
2009
ACM
16 years 5 months ago
2009
ACM
Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the Complementary Metal-Oxide-Semiconductor (CMOS)...
146
Voted
DAC
2000
ACM
16 years 5 months ago
2000
ACM
In this paper we describe an area efficient power minimization scheme "Control Generated ClockingI` that saves significant amounts of power in datapath registers and clock dr...