2877 search results - page 390 / 576 » The Complexity of Planarity Testing |
105
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ISQED
2007
IEEE
15 years 10 months ago
2007
IEEE
For emerging deep-subwavelength lithography technologies (90 nm and following) the data volume and the complexity of Optical Proximity Correction (OPC) have increased dramatically...
136
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QSIC
2007
IEEE
15 years 10 months ago
2007
IEEE
Web application testers need automated, effective approaches to validate the test results of complex, evolving web applications. In previous work, we developed a suite of automate...
124
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SMC
2007
IEEE
15 years 10 months ago
2007
IEEE
—Most virtual reality simulators are designed for complex medical procedures, such as laparoscopic surgery. While important, these simulators are of use for only a subset of spec...
138
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VTC
2007
IEEE
15 years 10 months ago
2007
IEEE
We investigate models for uplink interference in wireless systems. Our models account for the effects of outage probabilities. Such an accounting requires a nonlinear, even nonco...
158
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ATVA
2007
Springer
15 years 10 months ago
2007
Springer
Fault tree analysis is a traditional and well-established technique for analyzing system design and robustness. Its purpose is to identify sets of basic events, called cut sets, wh...