54 search results - page 4 / 11 » The ISPD98 circuit benchmark suite |
FPGA
2010
ACM
13 years 7 months ago
2010
ACM
Metastability is a phenomenon that can cause system failures in digital circuits. It may occur whenever signals are being transmitted across asynchronous or unrelated clock domain...
ASPDAC
2010
ACM
13 years 7 months ago
2010
ACM
This paper describes gate work function and oxide thickness tuning to realize novel circuits using dual-Vth independent-gate FinFETs. Dual-Vth FinFETs with independent gates enabl...
ISLPED
1995
ACM
14 years 1 months ago
1995
ACM
We present a transistor level power estimator which exploits algorithms for fast circuit simulation to compute the power dissipation of CMOS circuits. The proposed approach uses s...
AICCSA
2006
IEEE
13 years 11 months ago
2006
IEEE
To excite a stuck-open fault in a CMOS combinational circuit, it is only necessary that the output of the gate containing the fault takes on opposite values during the application...
TCAD
2010
13 years 4 months ago
2010
In response to the increasing variations in integrated-circuit manufacturing, the current trend is to create designs that take these variations into account statistically. In this ...