59 search results - page 12 / 12 » The Impact of Technology Scaling on Lifetime Reliability |
DAC
2006
ACM
14 years 11 months ago
2006
ACM
Three-dimensional (3-D) integrated circuits have emerged as promising candidates to overcome the interconnect bottlenecks of nanometer scale designs. While they offer several othe...
ISLPED
2009
ACM
14 years 5 months ago
2009
ACM
The theoretical lower limit of subthreshold swing in MOSFETs (60 mV/decade) significantly restricts low voltage operation since it results in a low ON to OFF current ratio at low ...
INTEGRATION
2008
13 years 11 months ago
2008
Thermal gradients across the die are becoming increasingly prominent as we scale further down into the sub-nanometer regime. While temperature was never a primary concern, its non...
IMC
2004
ACM
14 years 4 months ago
2004
ACM
Virtual Private Networks provide secure and reliable communication between customer sites. With increase in number and size of VPNs, providers need efficient provisioning techniqu...