24 search results - page 4 / 5 » The Method of Software Reliability Growth Models Choice Usin... |
ISQED
2008
IEEE
14 years 1 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
SIGSOFT
2007
ACM
14 years 8 months ago
2007
ACM
The systematic exploration of the space of all the behaviours of a software system forms the basis of numerous approaches to verification. However, existing approaches face many c...
POPL
2011
ACM
12 years 10 months ago
2011
ACM
We describe a new algorithm for proving temporal properties expressed in LTL of infinite-state programs. Our approach takes advantage of the fact that LTL properties can often be...
SADFE
2008
IEEE
14 years 1 months ago
2008
IEEE
Different users apply computer forensic systems, models, and terminology in very different ways. They often make incompatible assumptions and reach different conclusions about ...
JNW
2006
13 years 7 months ago
2006
With the standardization of IEEE 802.11, there has been an explosive growth of wireless local area networks (WLAN). Recently, this cost effective technology is being developed aggr...