694 search results - page 69 / 139 » The Power of the Middle Bit |
TC
2008
13 years 8 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
CORR
2008
Springer
13 years 8 months ago
2008
Springer
The classical problem of reliable point-to-point digital communication is to achieve a low probability of error while keeping the rate high and the total power consumption small. ...
ICIP
2007
IEEE
14 years 9 months ago
2007
IEEE
LVQ is a simple but powerful tool for vector quantization and can be viewed as a vector generalization of uniform scalar quantization. Like VQ, LVQ is able to take into account sp...
ICCAD
2007
IEEE
14 years 5 months ago
2007
IEEE
Abstract— Nanoscale technology promises dramatically increased device density, but also decreased reliability. With bit error rates projected to be as high as 10%, designing a us...
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...