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ICCAD
2006
IEEE
119views Hardware» more  ICCAD 2006»
16 years 1 months ago
Post-placement voltage island generation
High power consumption will shorten battery life for handheld devices and cause thermal and reliability problems. One way to lower the dynamic power consumption is to reduce the s...
Royce L. S. Ching, Evangeline F. Y. Young, Kevin C...
SIGSOFT
2009
ACM
15 years 11 months ago
MSeqGen: object-oriented unit-test generation via mining source code
An objective of unit testing is to achieve high structural coverage of the code under test. Achieving high structural coverage of object-oriented code requires desirable method-ca...
Suresh Thummalapenta, Tao Xie, Nikolai Tillmann, J...
KDD
2009
ACM
181views Data Mining» more  KDD 2009»
15 years 11 months ago
An exploration of climate data using complex networks
To discover patterns in historical data, climate scientists have applied various clustering methods with the goal of identifying regions that share some common climatological beha...
Karsten Steinhaeuser, Nitesh V. Chawla, Auroop R. ...
CEC
2009
IEEE
15 years 11 months ago
Task decomposition and evolvability in intrinsic evolvable hardware
— Many researchers have encountered the problem that the evolution of electronic circuits becomes exponentially more difficult when problems with an increasing number of outputs...
Tüze Kuyucu, Martin Trefzer, Julian Francis M...
MICRO
2009
IEEE
124views Hardware» more  MICRO 2009»
15 years 11 months ago
ZerehCache: armoring cache architectures in high defect density technologies
Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Large SRAM structures used for caches are particularly ...
Amin Ansari, Shantanu Gupta, Shuguang Feng, Scott ...
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