2 search results - page 1 / 1 » The Testability Features of The ARM1026EJ Microprocessor Cor... |
ITC
2003
IEEE
14 years 21 days ago
2003
IEEE
The DFT and Test challenges faced, and the solutions applied, to the ARM1026EJ microprocessor core are described in this paper. New DFT techniques have been created to address the...
ITC
2003
IEEE
14 years 21 days ago
2003
IEEE
The custom testability strategy of the Alpha 21364, Hewlett-Packard’s most recent Alpha microprocessor, builds upon its Alpha 21264 embedded core. Several additional DFT feature...