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ICSE
2009
IEEE-ACM
14 years 4 months ago
WISE: Automated test generation for worst-case complexity
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to ...
Jacob Burnim, Sudeep Juvekar, Koushik Sen
ICSE
2009
IEEE-ACM
14 years 4 months ago
Guided path exploration for regression test generation
Regression test generation aims at generating a test suite that can detect behavioral differences between the original and the modified versions of a program. Regression test gen...
Kunal Taneja, Tao Xie, Nikolai Tillmann, Jonathan ...
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
14 years 3 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
CLUSTER
2003
IEEE
14 years 3 months ago
Parallel Design Pattern for Computational Biology and Scientific Computing Applications
Dynamic programming is an important algorithm design technique in computational biology and scientific computing. Typical applications using this technique are very compute-intens...
Weiguo Liu, Bertil Schmidt
ETFA
2008
IEEE
14 years 4 months ago
Automatic generation of bond graph models of process plants
This paper presents an application for the automatic generation of Bond Graph models. The basis for this automated creation is a modified plant model in the XML-format according t...
Sebastian Beez, Alexander Fay, Nina F. Thornhill