570 search results - page 27 / 114 » The behavior of resistive circuits |
VTS
1996
IEEE
13 years 11 months ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
ISCAS
2008
IEEE
14 years 1 months ago
2008
IEEE
Abstract— This paper proposes a novel multiscroll chaotic system, which is different from Chua’s circuit and all its variants in most aspects of the algebraic form, circuit des...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Electronic energy disorder associated within amorphous and polycrystaline molecular organic thin film structures strongly affects the macroscopic observable behavior of organic fi...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
: With technology scaling, elevated temperatures caused by increased power density create a critical bottleneck modulating the circuit operation. With the advent of FinFET technolo...