Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
In contrast to classical databases and IR systems, real-world information systems have to deal increasingly with very vague and diverse structures for information management and s...
Xuan Zhou, Julien Gaugaz, Wolf-Tilo Balke, Wolfgan...
—Formal models are often used to verify systems and prove their correctness, and ensure that transformed models remain consistent to the original system. However, formal techniqu...
Boundary representation models reconstructed from 3D range data suffer from various inaccuracies caused by noise in the data and the model building software. Such models can be im...
Frank C. Langbein, A. David Marshall, Ralph R. Mar...
As order dependencies between process tasks can get complex, it is easy to make mistakes in process model design, especially behavioral ones such as deadlocks. Notions such as soun...
Mauro Gambini, Marcello La Rosa, Sara Migliorini, ...