7 search results - page 1 / 2 » The source-item coverage of the exponential function |
JOI
2007
13 years 7 months ago
2007
ESEM
2009
ACM
13 years 11 months ago
2009
ACM
Test coverage is a promising measure of test effectiveness and development organizations are interested in costeffective levels of coverage that provide sufficient fault removal w...
GLVLSI
1999
IEEE
13 years 11 months ago
1999
IEEE
This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...
SP
2010
IEEE
13 years 11 months ago
2010
IEEE
—To handle the growing flood of malware, security vendors and analysts rely on tools that automatically identify and analyze malicious code. Current systems for automated malwar...
ICNP
2007
IEEE
14 years 1 months ago
2007
IEEE
—We propose a new probabilistic coverage protocol (denoted by PCP) that considers probabilistic sensing models. PCP is fairly general and can be used with different sensing model...