Test coverage is a promising measure of test effectiveness and development organizations are interested in costeffective levels of coverage that provide sufficient fault removal w...
Audris Mockus, Nachiappan Nagappan, Trung T. Dinh-...
This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...
—To handle the growing flood of malware, security vendors and analysts rely on tools that automatically identify and analyze malicious code. Current systems for automated malwar...
Paolo Milani Comparetti, Guido Salvaneschi, Engin ...
—We propose a new probabilistic coverage protocol (denoted by PCP) that considers probabilistic sensing models. PCP is fairly general and can be used with different sensing model...