Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
The debate within the Web community over the optimal means by which to organize information often pits formalized classifications against distributed collaborative tagging systems...
Frequent itemset mining has been the subject of a lot of work in data mining research ever since association rules were introduced. In this paper we address a problem with frequen...
Existing virtual memory systems usually work well with applications written in C and C++, but they do not provide adequate support for garbage-collected applications. The performa...
Ting Yang, Emery D. Berger, Scott F. Kaplan, J. El...