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DAC
2007
ACM
14 years 8 months ago
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
DAC
2007
ACM
14 years 8 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
WWW
2007
ACM
14 years 8 months ago
The complex dynamics of collaborative tagging
The debate within the Web community over the optimal means by which to organize information often pits formalized classifications against distributed collaborative tagging systems...
Harry Halpin, Valentin Robu, Hana Shepherd
KDD
2004
ACM
126views Data Mining» more  KDD 2004»
14 years 8 months ago
Dense itemsets
Frequent itemset mining has been the subject of a lot of work in data mining research ever since association rules were introduced. In this paper we address a problem with frequen...
Heikki Mannila, Jouni K. Seppänen
OSDI
2006
ACM
14 years 8 months ago
CRAMM: Virtual Memory Support for Garbage-Collected Applications
Existing virtual memory systems usually work well with applications written in C and C++, but they do not provide adequate support for garbage-collected applications. The performa...
Ting Yang, Emery D. Berger, Scott F. Kaplan, J. El...