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ASYNC
2000
IEEE
14 years 2 months ago
2000
IEEE
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
STOC
2000
ACM
14 years 2 months ago
2000
ACM
We describe a slightly subexponential time algorithm for learning parity functions in the presence of random classification noise, a problem closely related to several cryptograph...
RAID
1999
Springer
14 years 2 months ago
1999
Springer
The rapid increase in network bandwidth from mega bits per second to giga bits per second and potentially to tera bits per second, is making it increasingly difficult to carry out...
ASPDAC
2007
ACM
14 years 1 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
SSIRI
2010
14 years 1 months ago
2010
—Software reliability is defined as the probability of failure-free operation for a period of time, under certain conditions. To determine whether the reliability of an applicat...