Sciweavers

4306 search results - page 12 / 862
» Timed Testing with TorX
Sort
View
TVLSI
2008
89views more  TVLSI 2008»
13 years 7 months ago
Test Set Development for Cache Memory in Modern Microprocessors
Up to 53% of the time spent on testing current Intel microprocessors is needed to test on-chip caches, due to the high complexity of memory tests and to the large amount of transis...
Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev, Sta...
ASPDAC
2007
ACM
140views Hardware» more  ASPDAC 2007»
13 years 11 months ago
An Architecture for Combined Test Data Compression and Abort-on-Fail Test
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
Erik Larsson, Jon Persson