4306 search results - page 16 / 862 » Timed Testing with TorX |
KDD
2000
ACM
13 years 11 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
RSP
2005
IEEE
14 years 1 months ago
2005
IEEE
For cost-effective prototyping, system designers should have a clear understanding of the intended use of the prototype under development. This paper describes a classification of...
CORR
2010
Springer
13 years 7 months ago
2010
Springer
Software testing is a critical element of software quality assurance and represents the ultimate review of specification, design and coding. Software testing is the process of tes...
INFSOF
2006
13 years 7 months ago
2006
Interaction testing is widely used in screening for faults. In software testing, it provides a natural mechanism for testing systems to be deployed on a variety of hardware and so...