4306 search results - page 188 / 862 » Timed Testing with TorX |
QSIC
2003
IEEE
14 years 4 months ago
2003
IEEE
In this paper, we consider a problem that arises in black box testing: generating small test suites (i.e., sets of test cases) where the combinations that have to be covered are s...
RSP
2003
IEEE
14 years 4 months ago
2003
IEEE
Model-based testing relies on the use of behavior models to automatically generate sequences of inputs and expected outputs. These sequences can be used as test cases to the end o...
DAC
2007
ACM
14 years 11 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
CP
2009
Springer
14 years 11 months ago
2009
Springer
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...
DDECS
2007
IEEE
14 years 5 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...