4306 search results - page 193 / 862 » Timed Testing with TorX |
STOC
2009
ACM
14 years 11 months ago
2009
ACM
We initiate a systematic study of a special type of property testers. These testers consist of repeating a basic test for a number of times that depends on the proximity parameter...
ISSRE
2006
IEEE
14 years 4 months ago
2006
IEEE
A Java monitor is a Java class that defines one or more synchronized methods. Unlike a regular object, a Java monitor object is intended to be accessed by multiple threads simulta...
VTS
2002
IEEE
14 years 3 months ago
2002
IEEE
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
ATS
2000
IEEE
14 years 3 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
DATE
2000
IEEE
14 years 3 months ago
2000
IEEE
The Boolean satisfiability problem (SAT) has various applications in electronic design automation (EDA) fields such as testing, timing analysis and logic verification. SAT has bee...