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SE
2007
13 years 9 months ago
An integration framework for heterogeneous automatic software tests
: Developing and maintaining large software systems can require the usage of a variety of different automatic test tools. The complexity of the tools leads to considerable overhead...
Holger Schackmann, Horst Lichter, Veit Hoffmann
ISCAS
2011
IEEE
210views Hardware» more  ISCAS 2011»
12 years 11 months ago
A mostly-digital analog scan-out chain for low bandwidth voltage measurement for analog IP test
—A method of precise measurement of on-chip analog voltages in a mostly-digital manner, with minimal overhead, is presented. A pair of clock signals is routed to the node of an a...
Rajath Vasudevamurthy, Pratap Kumar Das, Bharadwaj...
ISAAC
1992
Springer
125views Algorithms» more  ISAAC 1992»
13 years 11 months ago
A Simple Test for the Consecutive Ones Property
A (0,1)-matrix satisfies the consecutive ones property if there exists a column permutation such that the ones in each row of the resulting matrix are consecutive. Booth and Lueke...
Wen-Lian Hsu
ITC
1996
IEEE
99views Hardware» more  ITC 1996»
13 years 11 months ago
Detecting Delay Flaws by Very-Low-Voltage Testing
The detectability of delay flaws can be improved by testing CMOS IC's with a very low supply voltage -between 2 and 2.5 times the threshold voltage Vt of the transistors. A d...
Jonathan T.-Y. Chang, Edward J. McCluskey
ERSHOV
2003
Springer
14 years 22 days ago
Integration of Functional and Timed Testing of Real-Time and Concurrent Systems
The article presents an approach to model based testing of complex systems based on a generalization of finite state machines (FSM) and input output state machines (IOSM). The app...
Victor V. Kuliamin, Alexandre Petrenko, Nick V. Pa...