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VLSID
2010
IEEE
13 years 5 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
VTS
1996
IEEE
13 years 11 months ago
1996
IEEE
Some weak static CMOS chips can be detected by testing them with a very low supply voltage -- between 2 and 2.5 times the threshold voltage Vt of the transistors. A weak chip is o...
FSS
2010
13 years 4 months ago
2010
In this paper, we introduce a linearity test for fuzzy rule-based models in the framework of time series modeling. To do so, we explore a family of statistical models, the regime ...
GPC
2008
Springer
13 years 8 months ago
2008
Springer
Nowadays workflow systems are widely deployed around the world, especially within large international corporations. Thus the performance evaluation of these workflow systems becom...
PAMI
2011
13 years 2 months ago
2011
—Property testing is a rapidly growing field of research. Typically, a property testing algorithm proceeds by quickly determining whether an input can satisfy some condition, und...