4306 search results - page 43 / 862 » Timed Testing with TorX |
TIP
2008
13 years 7 months ago
2008
We present a two-stage method for obtaining both phase and object estimates from phase-diversity time series data. In the first stage, the phases are estimated for each time frame...
WSC
1998
1998
Effective Implementation of Cycle Time Reduction Strategies for Semiconductor Back-end Manufacturing
13 years 9 months ago
Using discrete-event simulation models, a study was conducted to evaluate the current production practices of a high-volume semiconductor back-end operation. The overall goal was ...
ISER
2000
Springer
13 years 11 months ago
2000
Springer
: To conduct tasks that need high dexterity by teleoperation, a unified hand/arm master-slave system was developed. To measure the dexterity of individual teleoperation systems all...
DFT
2002
IEEE
14 years 17 days ago
2002
IEEE
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
RTCSA
1999
IEEE
13 years 12 months ago
1999
IEEE
Replication is a well-know fault-tolerance technique, and several replication strategies exist (e.g. active, passive, and semi-active replication). To be used in hard real-time sy...