Sciweavers

4306 search results - page 62 / 862
» Timed Testing with TorX
Sort
View
ITC
1997
IEEE
73views Hardware» more  ITC 1997»
13 years 12 months ago
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Indradeep Ghosh, Niraj K. Jha, Sujit Dey
CISIS
2010
IEEE
13 years 11 months ago
A Pattern-Based Coordination and Test Framework for Multi-Agent Simulation of Production Automation Systems
— Production automation systems consist of many entities (like robots and shuttles) that interact in complex ways to provide the overall system functionality like product assembl...
Thomas Moser, Munir Merdan, Stefan Biffl
CEC
2009
IEEE
13 years 11 months ago
Automatic system identification based on coevolution of models and tests
In evolutionary robotics, controllers are often designed in simulation, then transferred onto the real system. Nevertheless, when no accurate model is available, controller transfe...
Sylvain Koos, Jean-Baptiste Mouret, Stéphan...
ALIFE
2004
13 years 7 months ago
Using Avida to Test the Effects of Natural Selection on Phylogenetic Reconstruction Methods
Phylogenetic trees group organisms by their ancestral relationships. There are a number of distinct algorithms used to reconstruct these trees from molecular sequence data, but dif...
George I. Hagstrom, Dehua H. Hang, Charles Ofria, ...
ETS
2011
IEEE
212views Hardware» more  ETS 2011»
12 years 7 months ago
Structural Test for Graceful Degradation of NoC Switches
Abstract—Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is...
Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-J...