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    PADS
    1997
    ACM
    135views Modeling and Simulation» more  PADS 1997»
    The Dark Side of Risk (what your mother never told you about Time Warp)
    14 years 1 months ago
    The Dark Side of Risk (what your mother never told you about Time Warp)
    Download  www.cs.dartmouth.edu
    This paper is a reminder of the danger of allowing \risk" when synchronizing a parallel discrete-event simulation: a simulation code that runs correctly on a serial machine m...
    David M. Nicol, X. Liu
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    VLSISP
    2008
    203views more  VLSISP 2008»
    FPGA-based System for Real-Time Video Texture Analysis
    13 years 8 months ago
    FPGA-based System for Real-Time Video Texture Analysis
    Download  rtsimage.di.uoa.gr
    This paper describes a novel system for real-time video texture analysis. The system utilizes hardware to extract 2nd -order statistical features from video frames. These features ...
    Dimitrios E. Maroulis, Dimitrios K. Iakovidis, Dim...
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    JFR
    2007
    144views more  JFR 2007»
    Real-Time SLAM with Octree Evidence Grids for Exploration in Underwater Tunnels
    13 years 8 months ago
    Real-Time SLAM with Octree Evidence Grids for Exploration in Underwater Tunnels
    Download  www.ri.cmu.edu
    We describe a Simultaneous Localization and Mapping (SLAM) method for a hovering underwater vehicle that will explore underwater caves and tunnels, a true three dimensional (3D) e...
    Nathaniel Fairfield, George Kantor, David Wettergr...
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    HICSS
    2007
    IEEE
    125views Biometrics» more  HICSS 2007»
    Reconciling Manual and Automated Testing: The AutoTest Experience
    14 years 3 months ago
    Reconciling Manual and Automated Testing: The AutoTest Experience
    Download  se.ethz.ch
    Software can be tested either manually or automatically. The two approaches are complementary: automated testing can perform a large number of tests in little time, whereas manual...
    Andreas Leitner, Ilinca Ciupa, Bertrand Meyer, Mar...
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    VLSI
    2005
    Springer
    127views Software Engineering» more  VLSI 2005»
    Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
    14 years 2 months ago
    Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
    Download  www.ida.liu.se
    1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
    Erik Larsson, Stina Edbom
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